Observation of monochromatic and tunable hard X radiation from stratified Si single crystals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 145, Issue 1-2, 1998, Pages 25-30

  Takashima, Y ^a   Aramitsu, K ^a   Endo, I ^a   Fukumi, A ^a   Goto, K ^a   Horiguchi, T ^a   Isshiki, T ^a   Kaplin, V ^e   Kobayashi, T ^a   Kondo, T ^a   Matsukado, K ^a   Muto, M ^b   Nakayama, K ^d   Nitta, H ^c   Okazaki, Y ^a   Potylitsin, A ^e   Takahashi, T ^a   Yoshida, K ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c TOKYO GAKUGEI UNIVERSITY   (Japan)

^d TOSHIBA CORPORATION   (Japan)

^e TOMSK POLYTECHNIC UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; ELECTRONS; PHOTONS; SILICON; X RAYS;

SELF-DIFFRACTED X RAYS (SDX);

SINGLE CRYSTALS;

EID: 0032475601     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00225-0     Document Type: Article

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