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Volumn 188, Issue 1-2, 1998, Pages 241-245
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Permanent magnetic MnBiRE0.1 (RE = Dy, Sm) evaporated films, crystal structure and magnetic properties as a function of film thickness
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Author keywords
Film thickness; Magnetic properties; Permanent magnetic film
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Indexed keywords
COERCIVE FORCE;
EVAPORATION;
LOW TEMPERATURE EFFECTS;
MAGNETIC ANISOTROPY;
MAGNETIZATION;
MANGANESE ALLOYS;
REMANENCE;
X RAY DIFFRACTION ANALYSIS;
THERMAL EVAPORATION;
MAGNETIC FILMS;
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EID: 0032475304
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(98)00162-0 Document Type: Article |
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Times cited : (11)
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References (7)
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