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Volumn 187, Issue 3-4, 1998, Pages 355-362

Diffusion mobility and defect analysis in GaSb

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY COMPOUNDS; CRYSTAL DEFECTS; DIFFUSION IN SOLIDS; HALL EFFECT; INTERMETALLICS; MICROSCOPIC EXAMINATION; SINGLE CRYSTALS; X RAY ANALYSIS;

EID: 0032474143     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(97)00847-6     Document Type: Article
Times cited : (6)

References (18)
  • 6
    • 0004248918 scopus 로고
    • Peter Pereginus. On Behalf of the Institution of Electrical Engineers, London
    • B. Tuck, Introduction to Diffusion in Semiconductors, Peter Pereginus. On Behalf of the Institution of Electrical Engineers, London, 1974.
    • (1974) Introduction to Diffusion in Semiconductors
    • Tuck, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.