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Applied Surface Science

Volumn 126, Issue 3-4, 1998, Pages 287-291

Morphology of porous silicon layers: Image of active sites from reductive deposition of copper onto the surface

(2) Coulthard, I a Sham, T K a

a UNIVERSITY OF WESTERN ONTARIO (Canada)

Author keywords

Morphology; Porous silicon; Reductive deposition

Indexed keywords

AGENTS; COPPER; DEPOSITION; FILMS; LUMINESCENCE; MORPHOLOGY; REDUCTION; SCANNING ELECTRON MICROSCOPY; SURFACES;

CHEMICALLY ACTIVE SITE; REDUCTIVE DEPOSITION;

POROUS SILICON;

EID: 0032473790 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00686-7 Document Type: Article

Times cited : (25)

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