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Volumn 126, Issue 3-4, 1998, Pages 303-308

XPS studies of copper deposition from 1,5-cyclooctadiene-copper(I)-hexafluoroacetylacetonate on Si(111)

Author keywords

Chemical vapour deposition; Copper; Copper organometallic precursor; Metal semiconductor interfaces; Metallic films; Photoelectron emission; Silicon; X ray photoelectron spectroscopy

Indexed keywords

CARBIDES; CHEMICAL VAPOR DEPOSITION; COPPER; DECOMPOSITION; DISSOCIATION; INTERFACES (MATERIALS); METALLIC FILMS; PHOTOEMISSION; SILICON; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032473781     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00583-7     Document Type: Article
Times cited : (12)

References (15)
  • 4
    • 0346591630 scopus 로고
    • Microelectronic Center of North Carolina
    • D. Temple, A. Reisman, Technical Report, Microelectronic Center of North Carolina, No. 4, 1988.
    • (1988) Technical Report , vol.4
    • Temple, D.1    Reisman, A.2
  • 12
    • 0347221553 scopus 로고
    • Ph.D. Thesis, The University of Western Ontario, London, Canada
    • E.C. Ou, Ph.D. Thesis, The University of Western Ontario, London, Canada, 1992.
    • (1992)
    • Ou, E.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.