Interface reaction of Ti and mullite ceramic substrate

Applied Surface Science

Volumn 126, Issue 3-4, 1998, Pages 255-264

  Yue, Ruifeng ^a,b,c   Wang, Youxiang ^b   Chen, Chunhua ^b   Xu, Chuanxiang ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c TSINGHUA UNIVERSITY   (China)

Author keywords

Annealing; Composition distribution; Interface reaction; Ti mullite interface

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CERAMIC MATERIALS; CHEMICAL BONDS; CHEMICAL REACTIONS; COMPOSITION; ELECTRON BEAMS; EVAPORATION; METALLIC FILMS; SECONDARY ION MASS SPECTROMETRY; TITANIUM; X RAY DIFFRACTION;

COMPOSITION DISTRIBUTION; INTERFACE REACTION; MULLITE CERAMIC SUBSTRATE;

INTERFACES (MATERIALS);

EID: 0032473776     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00407-8     Document Type: Article

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