Field-induced electroconformational damages in cell membrane proteins: A new mechanism involved in electrical injury

Bioelectrochemistry and Bioenergetics

Volumn 47, Issue 2, 1998, Pages 237-245

  Chen, Wei ^a   Han, Yu ^a   Chen, Yan ^a   Xie, Jing Tian ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Electric field; Electrical injury; Electroconformational changes; Gating current; K+ channels; Thermal effects

Indexed keywords

CELL MEMBRANES; CONFORMATIONS; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; POTASSIUM; PROTEINS;

ELECTRICAL INJURY; ELECTROCONFORMATION; GATING CURRENTS;

BIOMEDICAL ENGINEERING;

CELL MEMBRANE PROTEIN; POTASSIUM; POTASSIUM CHANNEL;

ANIMAL CELL; ANIMAL EXPERIMENT; ANIMAL MODEL; ANIMAL TISSUE; CELL MEMBRANE; CHANNEL GATING; CONFERENCE PAPER; CONTROLLED STUDY; ELECTRIC FIELD; ELECTRIC INJURY; ELECTRIC SHOCK; ELECTRICITY; NONHUMAN; SKELETAL MUSCLE; THERMAL INJURY;

EID: 0032446295     PISSN: 03024598     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0302-4598(98)00194-9     Document Type: Conference Paper

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