Automated optical liquid film thickness measurement method

Review of Scientific Instruments

Volumn 69, Issue 12, 1998, Pages 4205-4213

  Shedd, T A ^a   Newell, T A ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; FLUID FILM; MEASUREMENT METHOD; OPTICAL TECHNIQUE;

EID: 0032434592     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149232     Document Type: Article

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