An investigation of the relationship between analyte surface concentration and the extent of beam-induced dehalogenation in liquid secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry

Volumn 12, Issue 24, 1998, Pages 2004-2010

  Theberge R ^a   Bertrand, M J ^a,b  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

^b Regional Center for Mass Spectrometry   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANIONIC SURFACTANTS; SECONDARY EMISSION;

ANALYTES; DOPING AGENT; EXPERIMENTAL APPROACHES; FAST ATOM BOMBARDMENT; MATRIX; REACTIVE SPECIES; SECONDARY ION-MASS SPECTROMETRY; SURFACE CONCENTRATION;

SECONDARY ION MASS SPECTROMETRY;

EID: 0032432587     PISSN: 09514198     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0231(19981230)12:24<2004::AID-RCM427>3.0.CO;2-P     Document Type: Article

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