Dimensional metrology of nanometric spherical particles using AFM: II, application of model-tapping mode

Probe Microscopy

Volumn 1, Issue 2, 1998, Pages 117-125

  Garcia, V J ^a   Martinez, L ^a   Briceno Valero, J M ^a   Schilling, C H ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

Atomic force microscopy; Broadening effect; Tapping mode; Tip calibration

Indexed keywords

COLLOIDAL GOLD; SILICON;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MODEL; PARTICULATE MATTER; REPRODUCIBILITY;

EID: 0032420344     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)