Calibration and set-up of 100 kHz shear-force distance control for near- field optical microscopy

Probe Microscopy

Volumn 1, Issue 3, 1998, Pages 239-246

  Pedarnig, J D ^a   Gottlich, H ^a   Heckl, W M ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

100 kHz quartz tuning fork oscillators; Near field scanning optical microscopy (NSOM); Shear force calibration; Shear force detection

Indexed keywords

ARTICLE; CALIBRATION; IMAGE ANALYSIS; MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR STRESS; VIBRATION;

EID: 0032406385     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (29)