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Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3446, Issue , 1998, Pages 40-48

Detection of electron and hole traps in CdZnTe radiation detectors by thermoelectric emission spectroscopy and thermally stimulated conductivity

(6) Lee, E Y a Brunett, B A a Olsen, R W a Van Scyoc III, J M a Hermon, H a James, R B a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

ray detector; CdZnTe; Compensation; Current voltage; Radiation detector; Semiconductor radiation detector; TEES; Trap; TSC; X ray detector

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON TRAPS; EMISSION SPECTROSCOPY; HOLE TRAPS; RADIATION DETECTORS; SEMICONDUCTOR GROWTH; THERMAL EFFECTS; THERMOELECTRICITY;

BRIDGEMAN METHOD; CADMIUM ZINC TELLURIDE; THERMALLY STIMULATED CONDUCTIVITY; THERMOELECTRIC EMISSION SPECTROSCOPY;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032404352 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.312901 Document Type: Conference Paper

Times cited : (12)

References (9)

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