Simple refractometers for index measurements by minimum deviation method from far ultraviolet to near infrared

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 148-159

  Leviton, Douglas B ^a   Madison, Timothy J ^a   Petrone, Peter ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

Color filter glass; Deviation angle; Focal shift; Minimum deviation; Refractometer; Refractometry

Indexed keywords

IMAGING TECHNIQUES; INFRARED RADIATION; OPTICAL FILTERS; PHOTODETECTORS; PRISMS; REFRACTIVE INDEX; SPACE FLIGHT; ULTRAVIOLET RADIATION;

FOCAL SHIFT;

REFRACTOMETERS;

EID: 0032403988     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326672     Document Type: Conference Paper

References (9)

1. Interspecimen comparison of the refractive index of fused silica
2. The GSFC diffraction grating evaluation facility - An overview
3. Measuring efficiency of far ultraviolet optical systems in gaseous nitrogen
4. Optical metrology for the filter set for the Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS)
5. Refractometry by minimum deviation: Accuracy analysis
6. Prism refractometry and certain goniometrical requirements for precision
7. Standard conditions for precise prism refractometry
8. New ultra-high sensitivity, absolute, linear, and rotary encoders