Thin film transistor array technology for high performance, direct conversion X-ray sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3336, Issue , 1998, Pages 520-528

  Den Boer, Willem ^a   Aggas, Steven ^a   Byun, Young H ^a   Gu, Tieer ^a   Zhong, John Z Z ^a   Thomsen, Scott V ^a   Jeromin, Lothar S ^a   Lee, Denny L Y ^a  

^a Optical Imaging Systems Inc   (United States)

Author keywords

Direct Conversion X ray imaging; Direct Radiography; Large area TFT arrays; X ray sensors

Indexed keywords

CAPACITANCE; DIELECTRIC MATERIALS; ELECTRODES; IMAGE QUALITY; PASSIVATION; RADIOGRAPHY; SEMICONDUCTING SELENIUM; SIGNAL TO NOISE RATIO; THIN FILM TRANSISTORS; X RAYS;

X-RAY SENSORS;

IMAGE SENSORS;

EID: 0032403949     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.317054     Document Type: Conference Paper

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