Multispectral pyrometry for insulating material emissometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3425, Issue , 1998, Pages 126-133

  Thomas, Michael E ^a   Linevsky, Milton J ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

Emissometry; Multispectral pyrometry; Optical materials

Indexed keywords

CALIBRATION; INFRARED RADIATION; INSULATING MATERIALS; OPTICAL MATERIALS; PHONONS; PYROMETRY; SAPPHIRE; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS;

EMISSOMETRY;

LIGHT EMISSION;

EID: 0032402825     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.326659     Document Type: Conference Paper

References (7)

1. Infrared transmission of sapphire, spinel, yttria and ALON as a function of temperature and frequency
2. Optical constants of infrared active phonons as a function of frequency and temperature
3. A comprehensive model for the intrinsic transmission properties of optical windows
4. High temperature optical properties of oxide dome materials
5. High temperature optical properties of sapphire, AlON, yttria and spinel
6. Frequency and temperature dependence of the refractive index of sapphire
7. Imaging pyrometry of oxides