Accuracy and precision of 3D cephalometric landmarks from biorthogonal plain film x-rays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3335, Issue , 1998, Pages 50-58

  Dean, David ^a   Palomo, Martin ^a   Subramanyan, Krishna ^a   Hans, Mark G ^a   Broadbent Jr , B Holly ^a   Moullas, Alexander ^a   Macaraeg, Omar ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

3D; Cephalometrics; Craniofacial; Landmark; Skull; X my

Indexed keywords

BONE; COMPUTER AIDED DIAGNOSIS; ERRORS; PATIENT TREATMENT;

BIORTHOGONAL PLAIN FILMS;

X RAY RADIOGRAPHY;

EID: 0032401480     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312532     Document Type: Conference Paper

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