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Volumn 33, Issue 1, 1998, Pages 71-75

The growth and the electrical properties of epitaxial CrSi 2 films prepared on Si(111) substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032398806     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (24)
  • 7
  • 20
    • 18844385683 scopus 로고    scopus 로고
    • note
    • The quadruple crystal X-ray diffractometer (QCD) adopts four reflections from a single crystal in order to prepare a sharper monochromatic X-ray source than a commercial double crystal X-ray diffractometer (DCD).
  • 21
    • 18844421296 scopus 로고
    • Computer Graphics Service Ithaca, N.Y.
    • L. Doolittle and M. Thompson, RUMP, Computer Graphics Service (Ithaca, N.Y., 1992).
    • (1992) RUMP
    • Doolittle, L.1    Thompson, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.