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Volumn 16, Issue 2, 1998, Pages 595-606

Measurement and error evaluation of electrical parameters at plasma relevant frequencies and impedances

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032395989     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581098     Document Type: Article
Times cited : (8)

References (22)
  • 4
    • 0025825374 scopus 로고
    • International Society for Optical Engineering, Bellingham, WA
    • P. Rummel, in Proceedings of SPIE (International Society for Optical Engineering, Bellingham, WA, 1991), Vol. 1392, pp. 411-420
    • (1991) Proceedings of SPIE , vol.1392 , pp. 411-420
    • Rummel, P.1
  • 13
    • 11644259240 scopus 로고
    • Ph.D. Thesis, Stanford University
    • H. Shan, Ph.D. Thesis, Stanford University, 1991.
    • (1991)
    • Shan, H.1
  • 17
    • 85034306555 scopus 로고
    • Master's Thesis, University of Arizona
    • W. C. Roth, Master's Thesis, University of Arizona, 1995.
    • (1995)
    • Roth, W.C.1
  • 22
    • 85034302160 scopus 로고
    • Master's Thesis, University of California at Berkely
    • A. J. Miranda, Master's Thesis, University of California at Berkely, 1995.
    • (1995)
    • Miranda, A.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.