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Volumn 40, Issue 3, 1998, Pages 415-419

Thermooptical investigation of deep levels in doped Bi12SiO20 crystals

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EID: 0032395399     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1130335     Document Type: Article
Times cited : (9)

References (48)
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