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Volumn 16, Issue 5, 1998, Pages 3123-3126

Deposition rate dependence of step coverage of sputter deposited aluminums 1.5% copper films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0032394147     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581476     Document Type: Article
Times cited : (6)

References (19)
  • 4
    • 11644274178 scopus 로고    scopus 로고
    • EVOLVE was developed by T. S. Cale at Arizona State University and Motorola Inc. with funding from the Semiconductor Research Corporation and the National Science Foundation, Version 4.0 released October, 1994
    • EVOLVE was developed by T. S. Cale at Arizona State University and Motorola Inc. with funding from the Semiconductor Research Corporation and the National Science Foundation, Version 4.0 released October, 1994.
  • 5
    • 11644293810 scopus 로고    scopus 로고
    • Modeling of Film Deposition for Microelectronic Applications, edited by S. Rossnagel and A. Ulman, Academic, New York
    • T. S. Cale and V. Mahadev, in Modeling of Film Deposition for Microelectronic Applications, edited by S. Rossnagel and A. Ulman, Thin Films Vol. 22 (Academic, New York, 1996).
    • (1996) Thin Films , vol.22
    • Cale, T.S.1    Mahadev, V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.