X-ray linear birefringence and linear dichroism in a cobalt crystal measured with a tunable X-ray polarimeter

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 995-997

  Okitsu, Kouhei ^a,d   Oguchi, Takuyo ^b   Maruyama, Hiroshi ^c   Amemiya, Yoshiyuki ^d  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b RIKEN   (Japan)

^c OKAYAMA UNIVERSITY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

Author keywords

Polarization interferometry; Polarized XAFS; X ray birefringence; X ray dichroism; X ray polarimeters

Indexed keywords

EID: 0032393040     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598000855     Document Type: Article

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