Imaging soft X-ray microscope at Rits Synchrotron Radiation Center

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 1102-1104

  Hirai, A ^a   Takemoto, K ^b   Nishino, K ^a   Watanabe, N ^c   Anderson, E ^d   Attwood, D ^d   Kern, D ^e   Hettwer, M ^f   Rudolph, D ^f   Aoki, S ^c   Nakayama, Y ^a   Kihara, H ^b  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b KANSAI MEDICAL UNIVERSITY   (Japan)

^c UNIVERSITY OF TSUKUBA   (Japan)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e UNIVERSITY OF TÜBINGEN   (Germany)

^f UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Rits SR Center; X ray microscope; Zone plate

Indexed keywords

EID: 0032389705     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597018529     Document Type: Article

References (11)

1. Anderdon, E. & Kern, D. (1992). X-ray Microscopy III, edited by A. G. Michette, G. R. Morrison & C. J. Buckley, pp. 75-78. Berlin: Springer-Verlag.
2. Hirai, A., Watanabe, N., Takemoto, K., Nishino, K., Anderson, E., Attwood, D., Kern, D., Shimizu, S., Nagata, H., Aoki, S., Nakayama, Y. & Kihara, H. (1997). X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, D. Rudolph & E. Umbach. Heidelberg: Springer-Verlag.
3. Iwasaki, H., Nakayama, Y., Ozutsumi, K., Yamamoto, Y., Tokunaga, Y., Saisho, H., Matsubara, T. & Ikeda, S. (1997). J. Synchrotron Rad. 5, 1162-1165.
4. Niemann, B., Schneider, G., Guttmann, P., Rudolph, D. & Schmahl, G. (1994). X-ray Microscopy IV, edited by V. V. Aristov & A. I. Erko, pp. 66-75. Moscow: Bogorodskii Pechatnik.
5. Rudolph, D., Schneider, G., Guttmann, P., Schmahl, G., Niemann, B. & Thieme, J. (1992). X-ray Microscopy III, edited by A. G. Michette, G. R. Morrison & C. J. Buckley, pp. 392-396. Berlin: Springer-Verlag.
6. Sayre, D., Kirz, J., Feder. R., Kim. D. M. & Spiller, E. (1977). Ultramicroscopy, 2, 337-341.
7. Schmahl, G., Guttmann, P., Schneider, G., Niemann, B., David, C., Wilhein, T., Thieme, J. & Rudolph, D. (1996). X-ray Microscopy IV, edited by V. V. Aristov & A. I. Erko, pp. 196-206. Moscow: Bogorodskii Pechatnik.
8. Schmahl, G., Rudolph, D., Niemann, B., Guttmann, P., Thieme, J., Schneider, G., David, C., Diehl, M. & Wilhein, T. (1993). Optik, 93, 95-102.
9. Takemoto, K., Watanabe, N., Hirai, A., Nakayama, Y. & Kihara, H. (1997). X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, D. Rudolph & E. Umbach. Heidelberg: Springer-Verlag.
10. Watanabe, N., Aoki, S., Shimanuki, Y., Kawasaki, K., Taniguchi, M., Andersen, E., Attwood, D., Kern, D., Shimizu, S., Nagata, H., Horikawa, Y., Mochimaru, S. & Kihara, H. (1996). J. Electron Spectrosc. Relat. Phenom. 80, 365-368.
11. Watanabe, N., Hirai, A., Takemoto, K., Shimanuki, Y., Taniguchi, M., Anderson, E., Attwood, D., Kern, D., Shimizu, S., Kawasaki, K., Nagata, H., Aoki, S., Nakayama, Y. & Kihara, H. (1997). X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, D. Rudolph & E. Umbach. Heidelberg: Springer-Verlag.