New methods for semiconductor charge-diffusion-length measurements using synchrotron radiation

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 874-876

  Kohagura, J ^a   Cho, T ^a   Hirata, M ^a   Okamura, T ^a   Tamano, T ^a   Yatsu, K ^a   Miyoshi, S ^a   Hirano, K ^b   Maezawa, H ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Diffusion lengths; Multichannel detectors; Semiconductor detectors; X ray detectors; X ray response theory

Indexed keywords

EID: 0032384999     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597017524     Document Type: Article

References (7)

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