An ultrahigh-vacuum goniometer for in situ soft X-ray standing-wave analysis of semiconductor surfaces

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 1029-1031

  Sugiyama, Munehiro ^a   Maeyama, Satoshi ^a  

^a Bio Medical Informatics Research Center   (Japan)

Author keywords

Goniometers; Photoelectron spectroscopy; Semiconductor surfaces; X ray absorption near edge structure (XANES); X ray standing waves

Indexed keywords

EID: 0032384380     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597015549     Document Type: Article

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