Material analysis end-station of the Hyogo-ken beamline at SPring-8

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 509-511

  Kaneyoshi, T ^a   Ishihara, T ^a   Yoshioka, H ^a   Motoyama, M ^a   Fukushima, S ^b   Hayashi, K ^c   Kawai, J ^c   Taniguchi, K ^d   Hayakawa, S ^e   Gohshi, Y ^e  

^a Hyogo Prefectural Institute of Industrial Research Technical Center for Machinery and Metals   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

Polarized X ray emission spectroscopy; SPring 8; Surface analysis; X ray diffraction; X ray fluorescence analysis; X ray fluorescence holography

Indexed keywords

EID: 0032382515     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049598001502     Document Type: Article

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