Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 471-474

  Hwang, C S ^a   Fan, T C ^a   Lin, F Y ^a   Yeh, Shuting ^a   Chang, C H ^a   Chen, H H ^a   Tseng, P K ^b  

^a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^b TAMKANG UNIVERSITY   (Taiwan)

Author keywords

Elliptically polarizing undulators; Planar Hall effect; Three orthogonal Hall probe assembly

Indexed keywords

EID: 0032382514     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597013691     Document Type: Article

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