X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 1114-1116

  Hayakawa, Shinjiro ^a   Goto, Shunji ^b   Shoji, Takashi ^c   Yamada, Eiji ^c   Gohshi, Yohichi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c Rigaku Industrial Corporation   (Japan)

Author keywords

SPring 8; Trace element analysis; Wavelength dispersive spectrometers; X ray fluorescence

Indexed keywords

EID: 0032380849     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S090904959701892X     Document Type: Article

References (8)

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