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Volumn 43, Issue 2, 1998, Pages 180-187
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Ion bombardment of amorphous silicon films during plasma-enhanced chemical vapor deposition in an rf discharge
a a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032379642
PISSN: 10637842
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1258964 Document Type: Article |
Times cited : (6)
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References (20)
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