Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 911-913

  Cross, J O ^a   Elam, W T ^a   Harris, V G ^a   Kirkland, J P ^b   Bouldin, C E ^c   Sorensen, L B ^d  

^a NAVAL RESEARCH LABORATORY   (United States)

^b SFA INC   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Anomalous scattering; Diffraction anomalous fine structure; Sample angle feedback; XAFS

Indexed keywords

EID: 0032376362     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597014313     Document Type: Article

References (7)

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