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Volumn 5, Issue 3, 1998, Pages 989-991
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XAFS and X-MCD spectroscopies with undulator gap scan
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Author keywords
EXAFS; Spin polarized EXAFS; Undulator sources; X MCD
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Indexed keywords
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EID: 0032375435
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S0909049597014702 Document Type: Article |
Times cited : (23)
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References (9)
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