Influence of the microstructure on the surface potential of ferroelectric thick films

Journal of the Korean Physical Society

Volumn 32, Issue 3 SUPPL., 1998, Pages

  Haessler, W ^a   Huelz, H ^a   Ploss, Bernd ^b  

^a IFW DRESDEN   (Germany)

^b UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032374644     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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