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Volumn 40, Issue 6, 1998, Pages 906-908
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Scaling of the current-voltage characteristics of superconducting films in the flux creep model
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032374642
PISSN: 10637834
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1130472 Document Type: Article |
Times cited : (1)
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References (14)
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