Insertion devices for BESSY II

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 443-444

  Bahrdt, J ^a   Gaupp, A ^a   Ingold, G ^a   Scheer, M ^a   Gudat, W ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Insertion devices; Phase errors

Indexed keywords

EID: 0032363766     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597013757     Document Type: Article

References (5)

1. Bäcker, H., Bahrdt, J., Gaupp, A., Gottschlich, S., Horn, R., Ingold, G. & Meyer, G. (1995). BESSY Annual Report, pp. 539-541. BESSY, Berlin, Germany.
2. Bahrdt, J., Blümer, K., Gaupp, A., Ingold, G., Noll, T., Paziranebeh, R., Scheer, M. & Stahr, F. (1995). BESSY Annual Report, pp. 542-543. BESSY, Berlin, Germany.
3. Bahrdt, J., Gaupp, A., Ingold, G. & Scheer, M. (1996). Proc. EPAC96, Sitges, Barcelona, Vol. 3, pp. 2535-2537. Bristol: Institute of Physics.
4. Chavanne, J., Elleaume, P. & Van Vaerenbergh, P. (1995). Proc. PAC95, Dallas, Vol. 2, pp. 1319-1321. Piscataway, NJ: IEEE.
5. Sasaki, S., Kakuno, K., Takada, T., Shimada, T., Yanagida, K. & Miyahara, Y. (1993). Nucl. Instrum. Methods, A331, 763-767.