메뉴 건너뛰기




Volumn 37, Issue 34, 1998, Pages 8021-8029

Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; IMAGE QUALITY; INTERFEROMETERS; LIGHT REFLECTION; MIRRORS; MOLYBDENUM; OPTICAL MULTILAYERS; OPTICAL SYSTEMS; REFLECTIVE COATINGS; REFRACTIVE INDEX; SILICON; ULTRAVIOLET RADIATION;

EID: 0032362673     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.008021     Document Type: Article
Times cited : (8)

References (16)
  • 1
    • 0030257954 scopus 로고    scopus 로고
    • A phase-shifting point diffraction interferometer
    • H. Medecki, E. Tejnil, K. A. Goldberg, and J. Bokor, “A phase-shifting point diffraction interferometer, ” Opt. Lett. 21, 1526-1528 (1996).
    • (1996) Opt. Lett. , vol.21 , pp. 1526-1528
    • Medecki, H.1    Tejnil, E.2    Goldberg, K.A.3    Bokor, J.4
  • 3
    • 0001582350 scopus 로고    scopus 로고
    • Characterization of an EUV Schwarzschild objective using phase-shifting point diffraction interferometry
    • D. E. Seeger, ed., Proc. SPIE 3048
    • K. A. Goldberg, E. Tejnil, S. H. Lee, H. Medecki, D. T. Attwood, K. H. Jackson, and J. Bokor, “Characterization of an EUV Schwarzschild objective using phase-shifting point diffraction interferometry, ” in Emerging Lithographic Technologies, D. E. Seeger, ed., Proc. SPIE 3048, 264-70 (1997).
    • (1997) Emerging Lithographic Technologies , pp. 264-270
    • Goldberg, K.A.1    Tejnil, E.2    Lee, S.H.3    Medecki, H.4    Attwood, D.T.5    Jackson, K.H.6    Bokor, J.7
  • 4
    • 0000785539 scopus 로고    scopus 로고
    • Reflecting multilayer coatings for EUV projection lithography
    • G. D. Kubiak and D. R. Kania, eds, of OSA Trends in Optics and Photonics SeriesOptical Society of America, Washington, D.C
    • J. H. Underwood, “Reflecting multilayer coatings for EUV projection lithography, ” in Extreme Ultraviolet Lithography, G. D. Kubiak and D. R. Kania, eds., Vol. 4 of OSA Trends in Optics and Photonics Series (Optical Society of America, Washington, D.C., 1996), pp. 162-166.
    • (1996) Extreme Ultraviolet Lithography , vol.4 , pp. 162-166
    • Underwood, J.H.1
  • 5
    • 0001070396 scopus 로고
    • Multilayer facilities required for extreme-ultraviolet lithography
    • D. L. Windt and W. K. Waskiewicz, “Multilayer facilities required for extreme-ultraviolet lithography, ” J. Vac. Sci. Technol. B 12, 3826-3832 (1994).
    • (1994) J. Vac. Sci. Technol. B , vol.12 , pp. 3826-3832
    • Windt, D.L.1    Waskiewicz, W.K.2
  • 7
    • 85010176150 scopus 로고
    • Phase-shifting interferometry
    • 2nd ed., D. Malacara, ed. (Wiley, New York
    • J. E. Grievenkamp and J. H. Bruning, “Phase-shifting interferometry, ” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), pp. 501-598.
    • (1992) Optical Shop Testing , pp. 501-598
    • Grievenkamp, J.E.1    Bruning, J.H.2
  • 8
    • 0001380394 scopus 로고    scopus 로고
    • Reflectance measurements on clean surfaces for the determination of optical constants in the EUV/soft X-ray region
    • R. Soufli and E. M. Gullikson, “Reflectance measurements on clean surfaces for the determination of optical constants in the EUV/soft X-ray region, ” Appl. Opt. 36, 5499-5507 (1997)
    • (1997) Appl. Opt , vol.36 , pp. 5499-5507
    • Soufli, R.1    Gullikson, E.M.2
  • 9
    • 0004932883 scopus 로고
    • X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E = 50-30, 000 eV, Z = 1-92
    • B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E = 50-30, 000 eV, Z = 1-92, ” At. Data Nucl. Data Tables 54, 181-342 (1993).
    • (1993) At. Data Nucl. Data Tables , vol.54 , pp. 181-342
    • Henke, B.L.1    Gullikson, E.M.2    Davis, J.C.3
  • 10
    • 0038305429 scopus 로고
    • Effect of amplitude and phase dispersion on images in multilayer-coated soft-x-ray projection systems
    • J. Bokor, ed, of OSA Proceedings SeriesOptical Society of America, Washington, D.C
    • T. E. Jewell, “Effect of amplitude and phase dispersion on images in multilayer-coated soft-x-ray projection systems, ” in Soft X-Ray Projection Lithography, J. Bokor, ed., Vol. 12 of OSA Proceedings Series (Optical Society of America, Washington, D.C., 1991), pp. 113-118.
    • (1991) Soft X-Ray Projection Lithography , vol.12 , pp. 113-118
    • Jewell, T.E.1
  • 11
    • 0019609861 scopus 로고
    • Layered synthetic microstructures as Bragg diffractors for x rays and extreme ultraviolet: Theory and predicted performance
    • J. H. Underwood and T. W. Barbee, Jr., “Layered synthetic microstructures as Bragg diffractors for x rays and extreme ultraviolet: Theory and predicted performance, ” Appl. Opt. 20, 3027-3034 (1981).
    • (1981) Appl. Opt , vol.20 , pp. 3027-3034
    • Underwood, J.H.1    Barbee, T.W.2
  • 12
    • 0004055759 scopus 로고
    • SPIE, Bellingham, Wash, Chap. 7
    • E. Spiller, Soft X-Ray Optics (SPIE, Bellingham, Wash., 1994), Chap. 7.
    • (1994) Soft X-Ray Optics
    • Spiller, E.1
  • 13
    • 84990642391 scopus 로고
    • On the theory of reflectivity by an x-ray multilayer mirror
    • V. G. Kohn, “On the theory of reflectivity by an x-ray multilayer mirror, ” Phys. Status Solidi B 187, 61-70 (1995).
    • (1995) Phys. Status Solidi B , vol.187 , pp. 61-70
    • Kohn, V.G.1
  • 14
    • 26544432273 scopus 로고
    • Reflection and transmission of x rays by graded interfaces
    • A. Caticha, “Reflection and transmission of x rays by graded interfaces, ” Phys. Rev. B 52, 9214-9223 (1995).
    • (1995) Phys. Rev. B , vol.52 , pp. 9214-9223
    • Caticha, A.1
  • 15
    • 0000375505 scopus 로고
    • Interface imperfections in metal/Si multilayers
    • D. L. Windt, R. Hull, and W. K. Waskiewicz, “Interface imperfections in metal/Si multilayers, ” J. Appl. Phys. 71, 2675-2678 (1992).
    • (1992) J. Appl. Phys. , vol.71 , pp. 2675-2678
    • Windt, D.L.1    Hull, R.2    Waskiewicz, W.K.3
  • 16
    • 85010141561 scopus 로고    scopus 로고
    • Bell Laboratories, Room 1D-456, 700 Mountain Avenue, Murray Hill, N.J. 07974, personal communication, September
    • D. L. Windt, Bell Laboratories, Room 1D-456, 700 Mountain Avenue, Murray Hill, N.J. 07974 (personal communication, September 1997).
    • (1997)
    • Windt, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.