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Volumn 32, Issue 4 SUPPL., 1998, Pages

Characterization of c-axis oriented SrBi2Ta2O9 ferroelectric thin films deposited by plasma-enhanced metalorganic chemical vapor deposition on MOCVD-Pt/SiO2/Si

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[No Author keywords available]

Indexed keywords


EID: 0032361536     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (5)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.