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Volumn 32, Issue 4 SUPPL., 1998, Pages
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Characterization of c-axis oriented SrBi2Ta2O9 ferroelectric thin films deposited by plasma-enhanced metalorganic chemical vapor deposition on MOCVD-Pt/SiO2/Si
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0032361536
PISSN: 03744884
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (5)
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References (11)
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