An experiment on electron wave-particle duality including a Planck constant measurement

American Journal of Physics

Volumn 66, Issue 12, 1998, Pages 1055-1059

  Matteucci, G ^a   Beeli, C ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032355991     PISSN: 00029505     EISSN: None     Source Type: Journal    
DOI: 10.1119/1.19045     Document Type: Article

References (19)

1. D. Greenberger and A. Zeilinger, "Quantum theory: Still crazy after all these years," Phys. World 8 (9), 33-38 (1995).
2. A. Zeilinger, R. Gähler, C. G. Shull, W. Treimer, and W. Mampe, "Single and double-slit diffraction of neutrons," Rev. Mod. Phys. 60, 1067-1073 (1988).
3. R. Gähler and A. Zeilinger, "Wave-optical experiments with very cold neutrons," Am. J. Phys. 59, 316-324 (1991).
4. G. Matteucci, "Electron wave-like behaviour: A historical and experimental introduction," Am. J. Phys. 58, 1143-1147 (1990).
5. H. Boersch, H. Hamisch, D. Wohlleben, and K. Grohmann, "Antiparallele Weiss'sche Bereiche als Biprisma für Elektroneninterferenzen," Z. Phys. 159, 397-404 (1960).
6. H. Boersch, H. Hamisch, K. Grohmann, and D. Wohlleben, "Antiparallele Weiss'sche Bereiche als Biprisma für Elektroneninterterenzen," Z. Phys. 167, 72-82 (1962).
7. W. Ehrenberg and R. E. Siday, "The refractive index in electron optics and the principles of dynamics," Proc. Phys. Soc. 62, 8-21 (1949).
8. Y. Aharonov and D. Bohm, "Significance of electromagnetic potentials in the quantum theory," Phys. Rev. 115, 485-491 (1959).
9. G. Matteucci and G. Pozzi, "Two further experiments on electron interference," Am. J. Phys. 46, 619-623 (1978).
10. 6 single crystal allows one to obtain a higher brightness, which facilitates in our particular case the observation of interference phenomena.
11. The microscope is set in the "diffraction mode" using the largest camera length. In these operating conditions, an in-focus image of the magnetic specimen can be obtained with a suitable excitation of the diffraction lens D, Fig. 2, which acts as an objective lens. Subsequently, a suitable amount of de-focus (which corresponds to the distance from P to L of Fig. 2) was selected using the same lens. Further magnification is provided by the projector lens system PR (Fig. 2).
12. P. G. Merli, G. F. Missiroli, and G. Pozzi, "On the statistical aspect of the electron interference phenomena," Am. J. Phys. 44, 306-307 (1976).
13. A. Tonomura, J. Endo, T. Matsuda, and T. Kawasaki, "Demonstration of single-electron buildup of an interference pattern," Am. J. Phys. 57, 117-120 (1989).
14. G. R. Fowles, Introduction to Modern Optics (Dover, New York, 1989), 2nd ed., p. 77.
15. R. P. Feynman, R. B. Leighton, and M. Sands, The Feynman Lectures on Physics (Addison-Wesley, Reading, MA, 1965), Vol. II, Chap. 15, pp. 8-14.
16. T. H. Boyer, "Misrepresentation of the Aharonov-Bohm Effect," Am. J. Phys. 40, 56-59 (1972).
17. S. Olariu and I. I. Popescu, "The quantum effects of electromagnetic fluxes," Rev. Mod. Phys. 57, 339-436 (1985).
18. M. Peshkin and A. Tonomura, The Aharonov-Bohm Effect, Lecture Notes in Physics (Springer-Verlag, Berlin, Heidelberg, 1989).
19. R. E. Vermillion, "On presenting wave-particle duality using a simulated detector for multiple slit diffraction," Am. J. Phys. 62, 249-251 (1994).