Structure of ordered polyelectrolyte films from atomic-force microscopy and X-ray reflectivity data

Crystallography Reports

Volumn 43, Issue 1, 1998, Pages 124-128

  Belyaev, V V ^a   Tolstikhina, A L ^a   Stepina, N D ^a   Kayushina, R L ^a  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032355617     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

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2. Decher, G., Lvov, Yu.M., and Schmitt, J., Thin Solid Films, 1994, vol. 244, p. 772.
3. Kayushina, R.L., Stepina, N.D., Belyaev, V.V., and Khurgin, Yu.I., Kristallografiya, 1996, vol. 41, no. 1, p. 156.
4. Belugina, N.V. and Tolstikhina, A.L., Kristallografiya, 1996, vol. 41, no. 6, p. 1072.
5. Konovalov, O.V., Kristallografiya, 1992, vol. 37, no. 1, p. 192.
6. Kabanov, V.A. and Papisov, I.M., Vysokomol. Soedin., Ser. A, 1979, vol. 21, no. 2, p. 243.
7. Lvov, Yu.M. and Decher, G., Kristallografiya, 1994, vol. 39, no. 4, p. 696.
8. Lvov, Yu.M, Decher, G., and Mohwald, H., Langmuir, 1993, vol. 9, p. 481.
9. Sukhorukov, G., Schmitt, J., and Decher, G., Ber. Bunsen-Ges. Phys. Chem. B, 1996, vol. 100, no. 6, p. 948.