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Volumn 5, Issue 5, 1998, Pages 1057-1086

Structure of prototypical semiconductor surfaces and interfaces investigated by photoemission extended X-ray absorption fine structure (PEXAFS)

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EID: 0032352855     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X98001432     Document Type: Article
Times cited : (5)

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