Ca and spod for the analysis of tests comprised of binary items

Educational and Psychological Measurement

Volumn 58, Issue 6, 1998, Pages 916-928

  Maraun, Michael D ^a   Jackson, Jeremy S H ^b   Luccock, Craig R ^b   Belfer, Sharon E ^b   Chrisjohn, Roland D ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032352342     PISSN: 00131644     EISSN: None     Source Type: Journal    
DOI: 10.1177/0013164498058006004     Document Type: Article

References (23)

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