Experimental X-ray study of the correlation of the surface profiles of a film and a substrate

Crystallography Reports

Volumn 43, Issue 1, 1998, Pages 110-120

  Asadchikov, V E ^a   Karbekov, A Yu ^a   Klechkovskaya, V V ^a   Kozhevnikov, I V ^b   Levashov, V E ^b   Sagitov, S I ^b  

^a SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^b LEBEDEV PHYSICAL INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032351099     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

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