On Score Locations of Binary and Partial Credit Items and Their Applications to Item Mapping and Criterion-Referenced Interpretation

Journal of Educational and Behavioral Statistics

Volumn 23, Issue 1, 1998, Pages 35-56

  Huynh, Huynh ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

Bayesian updating; Criterion referenced measures; Item location; Item mapping; Likert scale; National Assessment of Educational Progress; Ordered categories; Partial credit model; Scale anchoring; Three parameter logistic model

Indexed keywords

EID: 0032349240     PISSN: 10769986     EISSN: None     Source Type: Journal    
DOI: 10.3102/10769986023001035     Document Type: Article

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