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0004222480
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Washington DC Chap 19
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Philoche-Levisalles, M.7
Bois, C.8
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7
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Julve, M.7
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8
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Bencini, A.1
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Gatteschi, D.5
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9
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37049071134
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Chen, Z.N.1
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37049077889
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b) Z. N. Chen, J. Qiu, Z. K. Wu, D. G. Fu, K. B. Yu, and W. X. Tang, J. Chem Soc., Dalton Trans., 1994, 1923.
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Chen, Z.N.1
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Tang, W.X.6
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11
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37049080747
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c) Z. N. Chen, S. X. Liu, J. Qiu, Z. M. Wang, J. L. Huang, and W. X. Tang, J. Chem. Soc., Dalton Trans., 1994, 2989,
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Chen, Z.N.1
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Tang, W.X.6
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d) Z. N. Chen, J. Qiu, W. X. Tang and K. B. Yu, Inorg. Chim. Acta, 224, 171 (1994).
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14944351907
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e) Z. N. Chen, J. L. Wang, J. Qiu, F. M. Miao, and W. X. Tang, Inorg Chem., 34, 2255 (1995).
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Chen, Z.N.1
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0001286538
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f) Z. N. Chen, W. X. Tang, F. M. Miao, and J. L. Wang, Polyhedron, 13, 2543 (1994).
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Chen, Z.N.1
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Wang, J.L.4
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16
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0041797339
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note
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2: C. 17.09; H. 2.87; N, 23.27%.
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17
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0042799621
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note
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-1): 3310(m), 3233(m), 3135(w), 2945(w), 2853(w), 2101(s), 1658(s), 1574(s), 1342(m), 1314(m), 1278(m),1032(m), 660(w), 572(w), 449(w).
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18
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0041296879
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note
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21
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0004150157
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Siemens Analytical X-ray Instruments, Inc.; Madison, WI
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G. M. Sheldrick, SHELXTL/PC, Siemens Analytical X-ray Instruments, Inc.; Madison, WI, 1990.
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(1990)
SHELXTL/PC
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Sheldrick, G.M.1
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