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Volumn 40, Issue 7, 1998, Pages 1135-1139

Thermooptic investigation of impurity centers in Cu-doped Bi12SiO20 crystals

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Indexed keywords


EID: 0032341746     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1130504     Document Type: Article
Times cited : (5)

References (45)
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