Parallel test construction using classical item parameters

Applied Psychological Measurement

Volumn 22, Issue 3, 1998, Pages 212-223

  Sanders, Piet F ^a   Verschoor, Alfred J ^b  

^a Cito group   (Netherlands)

^b NONE

Author keywords

Classical test theory; Greedy algorithms; Mathematical programming; Optimal test assembly; Parallel tests; Strongly parallel tests; Test construction; Weakly parallel tests

Indexed keywords

EID: 0032333688     PISSN: 01466216     EISSN: None     Source Type: Journal    
DOI: 10.1177/01466216980223002     Document Type: Article

References (9)

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