Characterization of asymmetric polysulfone membranes by atomic force microscopy

Revista Mexicana de Fisica

Volumn 44, Issue SUPPL.1, 1998, Pages 58-61

  Nazzarro, M S ^a   Ramirez Pastor, A J ^a   Riccardo, J L ^a   Ochoa, N A ^a   Marchese, J ^a  

^a UNIVERSIDAD NACIONAL DE SAN LUIS   (Argentina)

Author keywords

Amorphous surfaces; Atomic force microscopy; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0032333675     PISSN: 0035001X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

1. Loeb and Sourisajan, UCLA Report 60 (1960).
2. A. Bottino et al., J. Membrane Sci. 95 (1994) 289.
3. D. Dugar and P. Hausma, Phys. Today 43 (1990) 23.
4. N. Ochoa, C.L. Pagliero, and J. Marchese, Proceeding of International Congress on membrane an Membrane Process, Japan, (1996), p. 266.
5. J.M. Vara, Dpto. de Química Física Aplicada Univ. Autónoma de Madrid.
6. J.L Zubimendi et al., Phys. Rev. E 50 (1994) 2.
7. N.A. Ochoa, Doctoral Thesis, U.N. San Luis, Argentina, 1997.
8. J. M. Wienk et al., J. Membrane Sci. 113 (1996) 361.