Bayesian goodness-of-fit testing using infinite-dimensional exponential families

Annals of Statistics

Volumn 26, Issue 4, 1998, Pages 1215-1241

  Verdinelli, Isabella ^a   Wasserman, Larry ^b  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Bayes factor; Consistency; Gaussian process prior; Markov chain Monte Carlo; Nonparametric Bayesian inference; Sieve

Indexed keywords

EID: 0032330376     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/aos/1024691240     Document Type: Article

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