Electromagnetic and microstructural properties of pure c-axis twist Bi2Sr2CaCu2O8+δ bicrystal junctions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3480, Issue , 1998, Pages 21-28

  Tsay, Y N ^a   Li, Q ^a   Zhu, Y ^a   Suenaga, M ^a   Gu, G D ^a   Koshizuka, N ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); GRAIN BOUNDARIES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; SINGLE CRYSTALS; TUNNEL JUNCTIONS;

BICRYSTALS; MISORIENTATION ANGLES;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0032320861     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.332458     Document Type: Conference Paper

References (11)