On primitive fault test generation in non-scan sequential circuits

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1998, Pages 275-282

  Tekumalla, Ramesh C ^a   Menon, Prem R ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; FLIP FLOP CIRCUITS; SEQUENTIAL CIRCUITS; VECTORS;

NON-SCAN SEQUENTIAL CIRCUITS; PRIMITIVE FAULT TEST GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0032320383     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/288548.288625     Document Type: Conference Paper

References (25)