Reliability improvement of 980 nm laser diodes with a new facet passivation process

Conference Digest - IEEE International Semiconductor Laser Conference

Volumn , Issue , 1998, Pages 133-134

  Horie, H ^a   Ohta, H ^a   Fujimori, T ^a  

^a MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; PASSIVATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

FACET PASSIVATION PROCESSES;

SEMICONDUCTOR LASERS;

EID: 0032320368     PISSN: 08999406     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)