Texture characterization via joint statistics of wavelet coefficient magnitudes

IEEE International Conference on Image Processing

Volumn 1, Issue , 1998, Pages 62-66

  Simoncelli, Eero P ^a   Portilla, Javier ^a  

^a NEW YORK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION THEORY; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC FILTERS; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; IMAGE SEGMENTATION; MATRIX ALGEBRA; STATISTICS; WAVELET TRANSFORMS;

STATISTICAL MEASUREMENTS; TEXTURE REPRESENTATION; TEXTURE SEGMENTATION;

ALGORITHMS;

EID: 0032320110     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)